Imaging systems design; Digital image processing and machine vision; Semiconductor inspection; Optimization and signal processing; Medical imaging.
Dr. Edmund Lam received the B.S. degree (with distinction) in 1995, the M.S. degree in 1996, and the Ph.D. degree in 2000, all in electrical engineering from Stanford University.
At Stanford, he conducted research for the Programmable Digital Camera project in the Information Systems Laboratory. He also consulted for industry in the areas of digital camera systems design and algorithms development. Subsequently, as a senior imaging engineer in KLA-Tencor Corporation in San Jose, CA, he designed defect detection tools for the core die-to-die and die-to-database inspection of photomasks. The product received a Semiconductor International Editor's Choice Best Product Award, in addition to capturing a substantial market share.
He is now an Associate Professor in Electrical and Electronic Engineering, as well as the Medical Engineering Program, at the University of Hong Kong. He is also the founding director of its Imaging Systems Laboratory. His research interests include computational optics and imaging, particularly their applications in semiconductor manufacturing and biomedical systems. A couple of his papers were given best paper awards, including the First ASML/Cymer Best Student Paper Award in the SPIE Lithography Asia conference, and he received the Outstanding Young Researcher Award of the University of Hong Kong in 2008. With regards to teaching, he has taught at all levels of the departmental courses, and has been involved in the organization and teaching of a general education course for several years.
Besides his involvement within the university, he is also a topical editor of the Journal of the Optical Society of America A, an associate editor of the IEEE Transactions on Biomedical Circuits and Systems, and has twice been a guest editor of the Multidimensional Systems and Signal Processing journal published by Springer. He is also active in conference organizations, currently serving as a program committee member of SPIE conferences on Image Processing: Machine Vision Applications and Lithography Asia, as well as OSA's Signal Recovery and Synthesis meeting. He is a senior member of IEEE, and a member of OSA and SPIE. |