Through Wall Imaging: Inverse Scattering Approach
22 Feb, 2016 (Mon)
10:00 am
Room 204K

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Dr. Xudong Chen
Department of Electrical and Computer Engineering
National University of Singapore


Safe, reliable, high-quality and low-cost imaging technologies are growing requirements for the modern world. In many imaging applications, the shapes, locations and composite materials of objects are reconstructed from the measurement of electromagnetic fields scattered by these objects. Such imaging modality is referred to as reconstructed imaging. The problem of reconstructing such objects is basically an inverse scattering problem (ISP). This talk presents two inverse scattering models to achieve through wall imaging in the frequency domain. One model treats the wall as a part of inhomogeneous background medium and consequently the Green’s functions for inhomogeneous background are numerically calculated. The other model treats the wall as a known scatterer placed in a homogeneous background medium and then the permittivity of the wall is excluded from the retrieving process by a proper reformulation of the objective function. The advantages and disadvantages of the two models are discussed. Numerical simulations are performed to test the performance of the two models. Super-resolution imaging results are reported.


Biography of the speaker:

Dr. Xudong Chen received the B.S. and M.S. degrees in electrical engineering from Zhejiang University, China, in 1999 and 2001, respectively, and the Ph.D. degree from the Massachusetts Institute of Technology, USA, in 2005. Since then he joined the Department of Electrical and Computer Engineering, National University of Singapore, Singapore, and he is currently an Associate Professor. His research interests are mainly electromagnetic inverse problems. In particular, he is experienced in reconstructing electromagnetic parameters of obscured targets based on data of how they scatter incoming electromagnetic excitations. He has published about 130 peer-reviewed journal papers on inverse-scattering problems, material parameter retrieval, optical microscopy, and optical encryption. The total citation of his papers is more than 2600 according to ISI Web of Science (SCI). He visited the University of Paris-SUD 11 in May-June 2010 as an invited visiting Associate Professor. He took sabbatical leave at the Stanford University in 2012-2013, where he worked on microwave impedance tomography. He was the recipient of the Young Scientist Award by the Union Radio-Scientifique Internationale (URSI) in 2010 and the “Engineering Young Researcher Award” in the Faculty of Engineering, National University of Singapore in 2015.


Dr. L. Jiang

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