Best Paper Award 2015

The paper “An edge-from-focus approach to 3D inspection and metrology”, co-authored by Dr Fuqin Deng, Dr Kenneth Fung (both EEE PhD graduates), Prof. Edmund Lam, and several others have received the Best Paper Award (cum laude) in the IS&T/SPIE Electronic Imaging Symposium, 8-12 Feb 2015, in San Francisco, U.S.A.