Edmund Y. Lam  —  Publications

All keywords:

| 3D imaging | biomedical imaging | compressed sensing | computational imaging | computational lithography | deep learning | digital holography | education technology | electronic imaging | environment | high dynamic range imaging | light field | machine learning | machine vision and automation | magnetic resonance imaging | microscopy | optical coherence tomography | speckle | super-resolution | ulfrafast imaging |

Current keyword: machine vision and automation

Academic Journals:

  1. Chongguo Li, Nelson H.C. Yung, Xing Sun, and Edmund Y. Lam, “Human arm pose modeling with learned features using joint convolutional neural network,” Machine Vision and Applications, vol. 28, no. 1, pp. 1–14, February 2017.
    DOI: 10.1007/s00138-016-0796-0

  2. Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S.M. Fung, and Edmund Y. Lam, “An INSPECT measurement system for moving objects,” IEEE Transactions on Instrumentation and Measurement, vol. 64, no. 1, pp. 63–74, January 2015.
    DOI: 10.1109/TIM.2014.2329387

  3. Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S.M. Fung, Winghong Leung, and Edmund Y. Lam, “Illumination-invariant phase-shifting algorithm for three-dimensional profilometry of a moving object,” Optical Engineering, vol. 51, no. 9, pp. 097001(1–11), September 2012.
    DOI: 10.1117/1.OE.51.9.097001

  4. Fuqin Deng, Wui Fung Sze, Jiangwen Deng, Kenneth S.M. Fung, W.H. Leung, and Edmund Y. Lam, “Regularized multiframe phase-shifting algorithm for three-dimensional profilometry,” Applied Optics, vol. 51, no. 1, pp. 33–42, January 2012.
    DOI: 10.1364/AO.51.000033

  5. Mei Dong, Ronald Chung, Edmund Y. Lam, and Kenneth S.M. Fung, “Height inspection of wafer bumps without explicit 3D reconstruction,” IEEE Transactions on Electronics Packaging Manufacturing, vol. 33, no. 2, pp. 112–121, April 2010.
    DOI: 10.1109/TEPM.2010.2043361

  6. Ada N.Y. Ng, Edmund Y. Lam, Ronald Chung, Kenneth S.M. Fung, and W.H. Leung, “Reference-free machine vision inspection of semiconductor die images,” International Journal of Image and Graphics, vol. 9, no. 1, pp. 133–152, January 2009.
    DOI: 10.1142/S021946780900337X

  7. Yuan Shu, Ronald Chung, Zheng Tan, Jun Cheng, Edmund Y. Lam, Kenneth S.M. Fung, and Fan Wang, “Projection optics design for tilted projection of fringe pattern,” Optical Engineering, vol. 47, no. 5, pp. 053002(1–10), May 2008.
    DOI: 10.1117/1.2931457

  8. Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S.M. Fung, Fan Wang, and W.H. Leung, “Structure-light based sensing using a single fixed fringe grating: Fringe boundary detection and 3D reconstruction,” IEEE Transactions on Electronics Packaging Manufacturing, vol. 31, no. 1, pp. 19–31, January 2008.
    DOI: 10.1109/TEPM.2007.914209

  9. Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S.M. Fung, and Yangsheng Xu, “Optimization of bit-pairing codification with learning for 3D reconstruction,” International Journal of Image and Graphics, vol. 7, no. 3, pp. 445–462, July 2007.
    DOI: 10.1142/S0219467807002763

  10. Edmund Y. Lam, “Robust minimization of lighting variation for real-time defect detection,” Real-Time Imaging, vol. 10, no. 6, pp. 365–370, December 2004.
    DOI: 10.1016/j.rti.2004.08.001

Conference Proceedings:

  1. Sidhant Gupta, Thanh Bui, King-Shan Lui, and Edmund Y. Lam, “Laser quadrat and photogrammetry based autonomous coral reef mapping ocean robot,” in Intelligent Robotics and Industrial Applications using Computer Vision, pp. 450(1)–450(6), January 2019.
    DOI: 10.1117/1.AP.1.1.016004
    Best Student Paper Award

  2. Chongguo Li, Nelson H.C. Yung, and Edmund Y. Lam, “Human arm pose modeling with learned features using joint convolutional neural network,” in IAPR Conference on Machine Vision Applications, pp. 398–401, May 2015.
    DOI: 10.1109/MVA.2015.7153213

  3. Fuqin Deng, Jia Chen, Jianyang Liu, Zhijun Zhang, Jiangwen Deng, Kenneth S.M. Fung, and Edmund Y. Lam, “An edge-from-focus approach to 3D inspection and metrology,” in Image Processing: Machine Vision Applications, volume 9405 of Proceedings of the SPIE, pp. 94050E, February 2015.
    DOI: 10.1117/12.2074757
    Best Paper Award (cum laude)

  4. Fuqin Deng, Jianyang Liu, Jiangwen Deng, Kenneth S.M. Fung, and Edmund Y. Lam, “A three-dimensional imaging system for surface profilometry of moving objects,” in IEEE International Conference on Imaging Systems and Techniques, pp. 343–347, October 2013.
    DOI: 10.1109/IST.2013.6729718

  5. Fuqin Deng, Zhao Li, Jia Chen, Jiangwen Deng, Kenneth S.M. Fung, and Edmund Y. Lam, “An elliptic phase-shifting algorithm for high speed three-dimensional profilometry,” in Image Processing: Machine Vision Applications, volume 8661 of Proceedings of the SPIE, pp. 86610S, February 2013.
    DOI: 10.1117/12.2001417

  6. Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S.M. Fung, and Edmund Y. Lam, “A polynomial phase-shift algorithm for high precision three-dimensional profilometry,” in Image Processing: Machine Vision Applications, volume 8661 of Proceedings of the SPIE, pp. 866102, February 2013.
    DOI: 10.1117/12.2001418

  7. Fuqin Deng, Chang Liu, Wuifung Sze, Jiangwen Deng, Kenneth S.M. Fung, W.H. Leung, and Edmund Y. Lam, “An illumination-invariant phase-shifting algorithm for three-dimensional profilometry,” in Image Processing: Machine Vision Applications, volume 8300 of Proceedings of the SPIE, pp. 83000D, January 2012.
    DOI: 10.1117/12.911113

  8. Fuqin Deng and Edmund Y. Lam, “Three-dimensional surface recovery with a regularized multi-frame phase shift algorithm,” in OSA Topical Meeting in Signal Recovery and Synthesis, pp. SMD3, July 2011.
    DOI: 10.1364/SRS.2011.SMD3

  9. Fuqin Deng, Kenneth S.M. Fung, Jiangwen Deng, and Edmund Y. Lam, “An edge detection algorithm based on rectangular Gaussian kernels for machine vision applications,” in Image Processing: Machine Vision Applications, volume 7251 of Proceedings of the SPIE, pp. 72510N, January 2009.
    DOI: 10.1117/12.805241

  10. Jun Cheng, Ronald Chung, Edmund Y. Lam, and Kenneth S.M. Fung, “Handling of multi-reflections in wafer bump 3D reconstruction,” in IEEE International Conference on Systems, Man and Cybernetics, pp. 1558–1561, October 2008.
    DOI: 10.1109/ICSMC.2008.4811508

  11. Edmund Y. Lam, “Compact and thin multi-lens system for machine vision applications,” in Image Processing: Machine Vision Applications, volume 6813 of Proceedings of the SPIE, pp. 681305, January 2008.
    DOI: 10.1117/12.766435

  12. Mei Dong, Ronald Chung, Edmund Y. Lam, and Kenneth S.M. Fung, “Use of paraplanar constraint for parallel inspection of wafer bump heights,” in International Conference on Image Processing, Computer Vision, and Pattern Recognition, June 2007.

  13. Jun Cheng, Ronald Chung, and Edmund Y. Lam, “Structured light-based 3D reconstruction for device with a tiny size,” in European Conference on Computer Vision's 2nd Workshop on Applications of Computer Vision, pp. 128–136, May 2006.

  14. Yuan Shu, Ronald Chung, Zheng Tan, Jun Cheng, Edmund Y. Lam, Kenneth S.M. Fung, and Fan Wang, “A novel design of grating projecting system for 3D reconstruction of wafer bumps,” in Three-Dimensional Image Capture and Applications VII, volume 6056 of Proceedings of the SPIE, pp. 1–10, January 2006.
    DOI: 10.1117/12.650023

  15. Mei Dong, Ronald Chung, Yang Zhao, and Edmund Y. Lam, “Height inspection of wafer bumps without explicit 3D reconstruction,” in Machine Vision Applications in Industrial Inspection XIV, volume 6070 of Proceedings of the SPIE, pp. 27–34, January 2006.
    DOI: 10.1117/12.649228

  16. Yijiang Shen and Edmund Y. Lam, “Simultaneous photometric correction and defect detection in semiconductor manufacturing,” in Machine Vision Applications in Industrial Inspection XIV, volume 6070 of Proceedings of the SPIE, pp. 133–142, January 2006.
    DOI: 10.1117/12.640138

  17. Zhan Song, Ronald Chung, Jun Cheng, and Edmund Y. Lam, “Surface orientation recovery of specular micro-surface via binary pattern projection,” in Machine Vision Applications in Industrial Inspection XIV, volume 6070 of Proceedings of the SPIE, pp. 254–262, January 2006.
    DOI: 10.1117/12.650026

  18. Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S.M. Fung, Fan Wang, and W.H. Leung, “Boundary detection of projected fringes on surface with inhomogeneous reflectance function,” in Machine Vision Applications in Industrial Inspection XIV, volume 6070 of Proceedings of the SPIE, pp. 17–26, January 2006.
    DOI: 10.1117/12.648604

  19. Ada N.Y. Ng, Edmund Y. Lam, Ronald Chung, Kenneth S.M. Fung, and W.H. Leung, “Automatic segmentation for visual inspection in semiconductor manufacturing using multiscale morphology,” in 7th International Conference on Quality Control by Artificial Vision, pp. 215–220, May 2005.

  20. Jun Cheng, Ronald Chung, Edmund Y. Lam, Kenneth S.M. Fung, Fan Wang, and W.H. Leung, “Three-dimensional reconstruction of wafer solder bumps using binary pattern projection,” in Machine Vision Applications in Industrial Inspection XIII, volume 5679 of Proceedings of the SPIE, pp. 44–52, January 2005.
    DOI: 10.1117/12.586628

  21. Ada N.Y. Ng, Edmund Y. Lam, Ronald Chung, Kenneth S.M. Fung, and W.H. Leung, “Reference-free detection of semiconductor assembly defect,” in Machine Vision Applications in Industrial Inspection XIII, volume 5679 of Proceedings of the SPIE, pp. 27–35, January 2005.
    DOI: 10.1117/12.584883